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Volumn 23, Issue 5, 2010, Pages
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Surface morphology and thickness dependence of the properties of MgB 2 thin films by hybrid physical-chemical vapor deposition
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Author keywords
[No Author keywords available]
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Indexed keywords
CONTINUOUS FILMS;
FILM MORPHOLOGY;
FILM ROUGHNESS;
GRAIN SIZE;
GROWTH PARAMETERS;
HYBRID PHYSICAL-CHEMICAL VAPOR DEPOSITION;
OPTIMIZED DEPOSITION CONDITIONS;
ROOT MEAN SQUARE ROUGHNESS;
SUPERCONDUCTING PROPERTIES;
THICKNESS DEPENDENCE;
ULTRA-THIN;
VOLMER-WEBER MODES;
CHEMICAL VAPOR DEPOSITION;
DEPOSITION;
FILM GROWTH;
GRAIN GROWTH;
GRAIN SIZE AND SHAPE;
MORPHOLOGY;
SUPERCONDUCTING FILMS;
SUPERCONDUCTIVITY;
SURFACE CHEMISTRY;
THICK FILMS;
THIN FILMS;
SURFACE MORPHOLOGY;
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EID: 77951625219
PISSN: 09532048
EISSN: 13616668
Source Type: Journal
DOI: 10.1088/0953-2048/23/5/055004 Document Type: Article |
Times cited : (29)
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References (24)
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