High-speed 850 nm oxide-confined VCSELs for DATACOM applications

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7615, Issue , 2010, Pages

  Mutig, Alex ^a   Blokhin, Sergey ^a   Nadtochiy, Alexey M ^a   Fiol, Gerrit ^a   Lott, James A ^b   Shchukin, Vitaly A ^b   Ledenstov, Nikolai N ^b   Bimberg, Dieter ^a  

^a TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

^b VI SYSTEMS GMBH   (Germany)

Author keywords

Bit error rate test; Eye diagrams; High speed semiconductor lasers; Optical communication; Small signal modulation; Vertical cavity surface emitting lasers

Indexed keywords

BIT-ERRORS; EYE DIAGRAMS; HIGH-SPEED; HIGH-SPEED SEMICONDUCTOR LASERS; SMALL SIGNAL MODULATION; VERTICAL CAVITY SURFACE EMITTING LASER;

COMMUNICATION SYSTEMS; DATA COMMUNICATION SYSTEMS; HETEROJUNCTION BIPOLAR TRANSISTORS; LASER PULSES; LASERS; LIGHT MODULATION; LIGHT SOURCES; LIGHT TRANSMISSION; LOCAL AREA NETWORKS; MICROPROCESSOR CHIPS; OPTICAL COMMUNICATION; OPTICAL DATA STORAGE; OPTICAL FIBERS; OPTICAL LINKS; PHOTONICS; RESONANCE; SEMICONDUCTOR LASERS; SPEED; SURFACE EMITTING LASERS;

BIT ERROR RATE;

EID: 77951575402     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.840950     Document Type: Conference Paper

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