Ternary mixed monolayers for simultaneous DNA orientation control and surface passivation for label free DNA hybridization electrochemical sensing

Biosensors and Bioelectronics

Volumn 25, Issue 9, 2010, Pages 2129-2134

  Dharuman, V ^a   Chang, B Y ^b   Park, S M ^c   Hahn, J H ^b  

^a ALAGAPPA UNIVERSITY   (India)

^b Pohang University of Science and Technology (POSTECH)   (South Korea)

^c Ulsan National Institute of Science and Technology   (South Korea)

Author keywords

DNA hybridization; Electrochemical; Label free; Ternary layer; Thiol mixed monolayers

Indexed keywords

1-HEXANOL; 3-MERCAPTOPROPIONIC ACID; DETECTION LIMITS; DNA HYBRIDIZATION; ELECTROCHEMICAL LABELS; ELECTROCHEMICAL METHODS; ELECTROCHEMICAL SENSING; FOURIER TRANSFORM INFRARED; GOLD-COATED; HYDROGEN BONDINGS; IMPEDANCE SPECTROSCOPY; LABEL FREE; MIXED MONOLAYERS; MOLECULAR AFFINITY; ORIENTATION CONTROL; SENSING MECHANISM; SEQUENTIAL ADSORPTION; SILICON CHIP; SINGLE-STRANDED DNA; SURFACE PASSIVATION; TERNARY LAYERS; WIRE ELECTRODE;

ADSORPTION; BIOASSAY; BIOCHIPS; DNA; ELECTROCHEMICAL SENSORS; ELECTRON ENERGY LEVELS; GENES; GOLD COATINGS; HYDRAULIC STRUCTURES; HYDROGEN BONDS; INFRARED SPECTROSCOPY; LABELS; MONOLAYERS; PASSIVATION;

X RAY PHOTOELECTRON SPECTROSCOPY;

3 MERCAPTOPROPIONIC ACID; DILUENT; GOLD; SILICON; SINGLE STRANDED DNA; THIOL;

ANISOTROPY; ARTICLE; BINDING AFFINITY; BIOSENSOR; CONTROLLED STUDY; CYCLIC POTENTIOMETRY; DNA BINDING; DNA DETERMINATION; DNA HYBRIDIZATION; DNA MICROARRAY; DNA SEQUENCE; ELECTROCHEMICAL ANALYSIS; ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY; ELECTRODE; GENETIC PROCEDURES; HYDROGEN BOND; INFRARED SPECTROSCOPY; MATERIAL COATING; MICROCHIP ANALYSIS; RELIABILITY; REPRODUCIBILITY; SEQUENCE ANALYSIS; STATIC ELECTRICITY; X RAY PHOTOELECTRON SPECTROSCOPY;

BASE SEQUENCE; BIOSENSING TECHNIQUES; BRAIN NEOPLASMS; DNA; DNA PROBES; DNA, NEOPLASM; ELECTRIC IMPEDANCE; ELECTROCHEMICAL TECHNIQUES; HUMANS; KERATIN-20; LIMIT OF DETECTION; NUCLEIC ACID HYBRIDIZATION; PHOTOELECTRON SPECTROSCOPY; SPECTROSCOPY, FOURIER TRANSFORM INFRARED; SPECTRUM ANALYSIS; SURFACE PROPERTIES;

EID: 77951566573     PISSN: 09565663     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.bios.2010.02.019     Document Type: Article

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