Characterizing and controlling CU/(IN+GA) ratio during cis manufacturing

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2000, Pages 466-469

  Rühle, J Ulfert ^a   Wieting, Robert D ^a  

^a SIEMENS CORPORATE RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; MANUFACTURE; STATISTICAL PROCESS CONTROL;

DEPOSITION TIME; KEY PROCESS; MANUFACTURING IS; PROCESS THROUGHPUT; YIELD LOSS;

PROCESS CONTROL;

EID: 27944492088     PISSN: 01608371     EISSN: None     Source Type: Journal    
DOI: 10.1109/PVSC.2000.915872     Document Type: Article

References (7)

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2. R. D. Wieting, "CIS Product Introduction: Progress and Challenges", presented at the Program Review Meeting of the National Center for Photovoltaics, Denver, Colorado, September 1998
3. D. Tarrant, R. R. Gay, "Thin-Film Photovoltaic Partnership Program - CIS-based thin film PV Technology. Final Technical Report, Sept. 1995 through Dec. 1998", (Oct. 1999) NREL report NREUSR-520-27148
4. J. G. Miller and D. I. Bolef, J. Applied Phys. 39, pp 4589 and 5815 (1968)
5. Lu, Chih-Shun, J. Vac. Sci. Technology 12, (1975)
6. nd Edition, p. 48, SPC Press, Konxville, Tennessee, 1992
7. D. J. Wheeler, S. R. Poling, Building Continual Improvement, SPC Press, Knoxville, Tennessee, 1998