Degradation of ZnO-based window layers for thin-film CIGS by accelerated stress exposures

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7048, Issue , 2008, Pages

  Pern, F J ^a   Noufi, R ^b   To, B ^a   DeHart, C ^a   Li, X ^a   Glick, S H ^a  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

^b SoloPower Inc   (United States)

Author keywords

Accelerated exposure; CIGS; Damp heat; Degradation; Intrinsic and Al doped ZnO; Thin film solar cell; Transparent conducting oxides; Weatherometer; ZnMgO alloy

Indexed keywords

ACETIC ACID; ACIDS; CARRIER MOBILITY; CELLS; CONDUCTIVE FILMS; CYTOLOGY; DEGRADATION; GLASS; HYDROLYSIS; OPTICAL GLASS; PH; PH EFFECTS; PHOTODEGRADATION; PHOTOELECTRIC CELLS; PHOTOELECTROCHEMICAL CELLS; PHOTORESISTS; PHOTOVOLTAIC CELLS; RELIABILITY; SEMICONDUCTING ZINC COMPOUNDS; SOLAR CELLS; SOLAR ENERGY; SOLAR EQUIPMENT; SUBSTRATES; THIN FILM DEVICES; WINDOWS; X RAY DIFFRACTION ANALYSIS; ZINC; ZINC ALLOYS; ZINC OXIDE;

ACCELERATED EXPOSURE; CIGS; INTRINSIC AND AL-DOPED ZNO; THIN-FILM SOLAR CELL; TRANSPARENT CONDUCTING OXIDES; WEATHEROMETER; ZNMGO ALLOY;

ALUMINUM;

EID: 56249097234     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.795097     Document Type: Conference Paper

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