SVM-based feature extraction for face recognition

Pattern Recognition

Volumn 43, Issue 8, 2010, Pages 2871-2881

  Kim, Sang Ki ^a   Park, Youn Jung ^a   Toh, Kar Ann ^a   Lee, Sangyoun ^a  

^a Yonsei University   (South Korea)

Author keywords

Discriminant analysis; Face recognition; Identity verification; Support vector

Indexed keywords

COVARIANCE FUNCTION; ENVIRONMENTAL FACTORS; FACE FEATURE EXTRACTION; HYPERSURFACE; IDENTITY VERIFICATION; INHERENT LIMITATIONS; KERNEL TRICK; LINEAR DISCRIMINANT ANALYSIS; PHYSICAL APPLICATION; REGULARIZATION PROCESS; SCATTER MATRIX; SUPPORT VECTOR; WITHIN-CLASS SCATTER MATRIX;

DISCRIMINANT ANALYSIS; FEATURE EXTRACTION; SUPPORT VECTOR MACHINES;

FACE RECOGNITION;

EID: 77951258869     PISSN: 00313203     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.patcog.2010.03.008     Document Type: Article

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