|
Volumn 5, Issue 6, 2008, Pages 1746-1749
|
Energy relaxation processes of photo-generated carriers in Mg doped (0001)GaN and (1-101)GaN
|
Author keywords
[No Author keywords available]
|
Indexed keywords
DECAY CURVES;
ENERGY RELAXATION;
ENERGY RELAXATION PROCESS;
EXCESS CARRIERS;
EXCITATION SOURCES;
EXPONENTIAL DECAYS;
FAST PROCESS;
FEMTOSECOND PULSE;
GAN EPITAXIAL LAYERS;
IMPURITY BANDS;
MG-DOPED;
PHOTOGENERATED CARRIERS;
PHOTOLUMINESCENCE INTENSITIES;
ROOM TEMPERATURE;
TIME CONSTANTS;
ELECTRON MOBILITY;
GALLIUM ALLOYS;
LASER EXCITATION;
PULSED LASER APPLICATIONS;
RELAXATION PROCESSES;
GALLIUM NITRIDE;
|
EID: 77951221148
PISSN: 18626351
EISSN: 16101642
Source Type: Journal
DOI: 10.1002/pssc.200778620 Document Type: Conference Paper |
Times cited : (3)
|
References (14)
|