Seeing is believing: Electron microscopy for investigating nanostructures

Journal of Physical Chemistry Letters

Volumn 1, Issue 8, 2010, Pages 1212-1220

  Ravishankar, N ^a  

^a INDIAN INSTITUTE OF SCIENCE   (India)

Author keywords

[No Author keywords available]

Indexed keywords

IN-SITU OBSERVATIONS; INDISPENSABLE TOOLS; LENGTH SCALE; NANO SCALE; RESOLUTION LEVEL; TEM; TRANSMISSION ELECTRON MICROSCOPE;

ELECTRON MICROSCOPES; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

NANOSTRUCTURES;

EID: 77951195166     PISSN: None     EISSN: 19487185     Source Type: Journal    
DOI: 10.1021/jz100163x     Document Type: Article

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