Design and measurements of SEU tolerant latches

Proceedings of the Topical Workshop on Electronics for Particle Physics, TWEPP 2008

Volumn , Issue , 2008, Pages 402-405

  Menouni, M ^b   Arutinov, D ^a   Barbero, M ^a   Beccherle, R ^b   Breugnon, P ^d   Ely, R ^c   Fougeron, D ^d   Garcia Sciveres, M ^c   Gnani, D ^c   Hemperek, T ^a   Karagounis, M ^a   Kluit, R ^e   Mekkaoui, A ^c   Rozanov, A ^d   Schipper, J D ^e  

^a UNIVERSITY OF BONN   (Germany)

^b INFN SEZIONE DI GENOVA   (Italy)

^c LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^d CENTRE DE CALCUL DE L INSTITUT NATIONAL DE PHYSIQUE NUCLEAIRE ET DE PHYSIQUE DES PARTICULES   (France)

^e NIKHEF   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ADJACENT NODES; CHARGE SHARING; DICE LATCH; DUAL INTERLOCKED STORAGE CELLS; LAYOUT CONSIDERATIONS; MEASUREMENTS OF; SINGLE EVENT UPSETS;

ELECTRONICS ENGINEERING;

EID: 77951190173     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

1. ATLAS Collaboration, Inner Tracker "Technical Design Report, 1, CERN-LHCC-97-016; Inner Tracker: Technical Design Report,", 2, CERN-LHCC-97-017
2. Seung Ji, Bob Ely, Daniel Hallberg, Kevin Einsweiler, M. Garcia-Sciveres: "Irradiation of 0.13um ATLAS pixel test chip," 12th Workshop on Electronics for LHC and Future Experiments 25-29 September, 2006 Valencia, Spain
3. D. Hallberg "ATLAS Pixel Detector Upgrade: A study of a prototype readout chip manufactured in 0.13 μm technology," Master thesis presented at Lund Institute of Technology, Lund, Sweden March 2005
4. M. Karagounis et al. "Development of the ATLAS FE-I4 pixel readout IC for b-layer Upgrade and Super-LHC," submitted to TWEPP 2008
5. T. Calin, M. Nicolaidis, R. Velazco, "Upset Hardened Memory by Design for Submicron CMOS technology," IEEE Trans. Nucl. Sci., Vol. 43, pp. 2874-2878, Dec. 1996
6. J.D. Black et al. "HBD Layout Isolation Techniques for Multiple Node Charge Collection Mitigation," IEEE Trans. Nucl. Sci., Vol. 52, pp. 2536-2541, Dec.2005
7. th Annual International Reliability Physics Symposium, Phoenix, 2007