Charge transport in flat and nanorod structured ruthenium thin films

Applied Physics Letters

Volumn 96, Issue 14, 2010, Pages

  Steeves, M M ^a   Deniz, D ^a   Lad, R J ^a  

^a 5708 ESRB Barrows Hall ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE TRANSPORT; DEFECT ANNEALING; EFFECTIVE THICKNESS; FILM-SUBSTRATE INTERFACES; FLAT FILMS; HALL COEFFICIENT; POLYCRYSTALLINE LAYERS; RU THIN FILMS; STRUCTURED FILMS; ULTRA-THIN;

DEFECTS; NANORODS; RUTHENIUM;

ULTRATHIN FILMS;

EID: 77951171547     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3377006     Document Type: Article

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