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Volumn 157, Issue 5, 2010, Pages

Growth laws of bilayer anodized tantalum oxide films formed in phosphoric acid

Author keywords

[No Author keywords available]

Indexed keywords

ANODIZATIONS; BI-LAYER; FORMATION VOLTAGE; GROWTH LAWS; INNER LAYER; INTERSTITIALS; IONIC CURRENT; IR REFLECTANCE SPECTROSCOPY; OUTER LAYER; OXIDE THICKNESS; PARAMETRIZATIONS; POTENTIODYNAMICS; TIME DOMAIN;

EID: 77951158741     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.3327883     Document Type: Article
Times cited : (14)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.