Repulsive force of twin boundary on curved dislocations and its role on the yielding of twinned nanowires

Scripta Materialia

Volumn 63, Issue 1, 2010, Pages 50-53

  Deng, Chuang ^a,b   Sansoz, Frederic ^a  

^a UNIVERSITY OF VERMONT   (United States)

^b Massachusetts Institute of Technology   (United States)

Author keywords

Dislocation theory; Nanowires; Size effects; Twin grain boundary; Yield phenomena

Indexed keywords

ATOMISTIC SIMULATIONS; AU NANOWIRES; DISLOCATION THEORY; IMAGE FORCE; METAL NANOSTRUCTURE; METAL NANOWIRE; NANOSCALE GROWTH TWINS; REPULSIVE FORCES; SAMPLE DIAMETER; SIZE EFFECTS; SURFACE DISLOCATION; THEORETICAL STUDY; TWIN BOUNDARIES; YIELD CRITERIA; YIELD PHENOMENON;

GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; NANOWIRES;

YIELD STRESS;

EID: 77951106271     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2010.03.005     Document Type: Article

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