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Volumn , Issue , 2009, Pages 870-873

Nano-magnet based ultra-low power logic design using non-majority gates

Author keywords

[No Author keywords available]

Indexed keywords

CMOS TECHNOLOGY; DESIGN APPROACHES; MAJORITY GATES; NARROW GAP; PERFORMANCE METRICES; POWER; ULTRA-LOW POWER;

EID: 77950968374     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (3)

References (10)
  • 1
    • 36248956669 scopus 로고    scopus 로고
    • Research directions in beyond CMOS computing
    • DOI 10.1016/j.sse.2007.09.018, PII S0038110107003292, Papers Selected from the 36th European Solid-State Device Research Conference - ESSDERC'06
    • G.I. Bourianoff et. al., "Research directions in beyond CMOS computing", Solid-State Electronics, pp. 1426-1431, 2007. (Pubitemid 350138026)
    • (2007) Solid-State Electronics , vol.51 , Issue.11-12 , pp. 1426-1431
    • Bourianoff, G.I.1    Gargini, P.A.2    Nikonov, D.E.3
  • 2
    • 4143119129 scopus 로고    scopus 로고
    • Exchange-Biased Magnetic Tunnel Junctions and Application to Nonvolatile Magnetic Random Access Memory
    • S. S. P. Parkin et. al, "Exchange-Biased Magnetic Tunnel Junctions and Application to Nonvolatile Magnetic Random Access Memory," J. Appl. Phys. 85, No. 8, 5828-5833, 1999.
    • (1999) J. Appl. Phys. , vol.85 , Issue.8 , pp. 5828-5833
    • Parkin, S.S.P.1
  • 3
    • 30844442443 scopus 로고    scopus 로고
    • Majority Logic Gate for Magnetic Quantum-Dot Cellular Automata
    • A. Imre et al.,"Majority Logic Gate for Magnetic Quantum-Dot Cellular Automata", Science 311, 205 (2006).
    • (2006) Science , vol.311 , pp. 205
    • Imre, A.1
  • 5
    • 0034480928 scopus 로고    scopus 로고
    • On-Line Built-In Self-Test for Operational Faults
    • H. Al-Asaad et. al., "On-Line Built-In Self-Test for Operational Faults," Proc. SRT Conf., pp. 168-174, 2000.
    • (2000) Proc. SRT Conf. , pp. 168-174
    • Al-Asaad, H.1
  • 7
    • 77950981072 scopus 로고    scopus 로고
    • http://www.patentstorm.us/patents/6559511/description.html
  • 8
    • 77950968304 scopus 로고    scopus 로고
    • Maxwell, Ansys, Inc., Canonsburg, PA
    • Maxwell, Ansys, Inc., Canonsburg, PA.
  • 9
    • 44949227132 scopus 로고    scopus 로고
    • MOSFET performance scaling - Part I: Historical trends
    • DOI 10.1109/TED.2008.921017
    • A. Khakifirooz et. al., "MOSFET Performance Scaling - Part I: Historical Trends", IEEE TED. vol.55, no.6, pp. 1391-1400, 2008. (Pubitemid 351803240)
    • (2008) IEEE Transactions on Electron Devices , vol.55 , Issue.6 , pp. 1391-1400
    • Khakifirooz, A.1    Antoniadis, D.A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.