The microstructure and dielectric relaxor behavior of BaBi4-xLaxTi4O15 ferroelectric ceramics

Journal of Alloys and Compounds

Volumn 497, Issue 1-2, 2010, Pages 416-419

  Fang, Pinyang ^a   Fan, Huiqing ^a   Li, Jin ^a   Chen, Lei ^a   Liang, Fujun ^a  

^a NORTHWESTERN POLYTECHNICAL UNIVERSITY   (China)

Author keywords

BBT; Ferroelectrics; Relaxation phase transition

Indexed keywords

BBT; BI-LAYERED PEROVSKITE; DIELECTRIC CONSTANTS; DIELECTRIC RELAXOR; HIGH TEMPERATURE PHASE TRANSITIONS; HIGHER TEMPERATURES; ORTHORHOMBIC STRUCTURES; QUADRATIC FIT; RELAXOR BEHAVIOR; RELAXOR FERROELECTRIC; RELAXORS; SOLID-STATE REACTION PROCESS; XRD;

FERROELECTRIC CERAMICS; FERROELECTRICITY; LANTHANUM; LANTHANUM ALLOYS; OXIDE MINERALS; PEROVSKITE; SINGLE CRYSTALS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

PHASE TRANSITIONS;

EID: 77950960187     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2010.03.092     Document Type: Article

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