Raman scattering of ZnO films prepared by the laser molecular beam epitaxy

Materials Science- Poland

Volumn 28, Issue 1, 2010, Pages 153-161

  Wang, C ^a   Chen, Z ^b   He, Y ^a   Li, L ^a   Zhang, D ^a  

^a LIAOCHENG UNIVERSITY   (China)

^b NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

Laser molecular beam epitaxy; Raman scattering; X ray diffraction; ZnO films

Indexed keywords

CRYSTAL QUALITIES; LASER MOLECULAR BEAM EPITAXY; OXYGEN PRESSURE; RAMAN FREQUENCIES; RAMAN SPECTRA; SI (100) SUBSTRATE; SUBSTRATE TEMPERATURE; SURFACE ENHANCED RAMAN SPECTROSCOPY; VARIOUS SUBSTRATES; ZNO FILMS; ZNO SINGLE CRYSTALS;

CRYSTAL GROWTH; FILM PREPARATION; METALLIC FILMS; MOLECULAR BEAM EPITAXY; MOLECULAR BEAMS; MOLECULAR OXYGEN; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SCATTERING; SEMICONDUCTOR QUANTUM WIRES; SINGLE CRYSTALS; X RAY DIFFRACTION; ZINC OXIDE;

X RAY DIFFRACTION ANALYSIS;

EID: 77950941683     PISSN: 01371339     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (18)

1. MANDALAPU L.J., XIU F., YANG Z., LIU J.L., Solid State Electr., 51 (2007), 1014.
2. HUANG F.C., CHEN Y.Y., WU T.T., Nanotechn., 20 (2009), 065501.
3. BASU P.K., JANA S.K., MITRA M.K., SAHA H., BASU S., Sens. Lett., 6 (2008), 699.
4. MINAMI T., MIYATA T., Thin Solid Films, 517 (2008), 1474.
5. ASHKENOV N., MBENKUM B.N., BUNDESMANN C., RIEDE V., LORENZ M., SPEMANN D., KAIDASHEV E.M., KASIC A., SCHUBERT M., GRUNDMANN M., J. Appl. Phys., 93 (2003),126.
6. STILES P.L., DIERINGER J.A., SHAH N.C., VAN DUYNE R.R., Ann. Rev. Anal. Chem., 1 (2008), 601.
7. ARGUELLO C.A., ROUSSEAU D.L., PORTO S.P.S., Phys. Rev., 181(1969), 1351.
8. WANG X.B., SONG C., GENG K.W., ZENG F., PAN F., Appl. Surf. Sci., 253 (2007), 6905.
9. ZHANG Y., JIA H.B., WANG R.M., CHEN C.P., LUO X.H., YU D.P., Appl. Phys. Lett., 83 (2003), 4631.
10. BUNDESMANN C., ASHKENOV N., SCHUBERT M., SPEMANN D., BUTZ T., KAIDASHEV E.M., LORENZ M., GRUNDMANN M., Appl. Phys. Lett., 83 (2003), 1974.
11. DCREMPS F., PELLICER-PORRES J., SAITTA A.M., CHERVIN J.C., POLIAN A., Phys. Rev. B, 65 (2002), 092101.
12. SERRANO J., MANJÓN F.J., ROMERO A.H., WIDULLE F., LAUCK R., CARDONA M., Phys. Rev. Lett., 90 (2003), 055510.
13. ZENG J.N., LOW J.K., REN Z.M., LIEW T., LU Y.F., Appl. Surf. Sci., 197/198 (2002), 362.
14. CHEN Y., BAGNALL D.M., KOH H.J., PARK K.T., HIRAGA K.J., ZHU Z.Q., YAO T., J. Appl. Phys., 84 (1998), 3912.
15. HONG R.J., HUANG J.B., HE H.B., FAN Z.X., SHAO J.D., Appl. Surf. Sci., 242 (2005), 346.
16. CULLITY B.D., Elements of X-ray Diffractions, Addison-Wesley, Reading, MA, 1978.
17. THORNTON J.A., HOFFMAN D.W., Thin Solid Films, 171 (1989), 5.
18. HONG R.J., QI H.J., HUANG J.B., HE H.B., FAN Z.X., SHAO J.D., Thin Solid Films, 473(2005), 58.