Investigation of transmittance property of Palladium thin films fabricated by pulsed laser deposition with polarization using single layer model

Optics and Laser Technology

Volumn 42, Issue 7, 2010, Pages 1128-1133

  Singh, Udaibir ^a   Jha, Nisha ^a   Prakash Singh, Tikendra ^a   Kapoor, Avinashi ^a   Perrone, Alessio ^b  

^a UNIVERSITY OF DELHI   (India)

^b UNIVERSITY OF SALENTO   (Italy)

Author keywords

Palladium thin films; Pulsed laser deposition; Transmission spectra

Indexed keywords

AFM; ANGLE OF INCIDENCE; DIFFERENT SUBSTRATES; GLASS SUBSTRATES; INCIDENT ANGLES; P-POLARIZATION; PD THIN FILMS; PULSE LASER DEPOSITION; RMS ROUGHNESS; SINGLE-LAYER MODELS; THEORETICAL VALUES; TRANSMISSION MEASUREMENTS; TRANSMISSION SPECTRUMS; TRANSMITTANCE SPECTRA; UV-VIS-NIR SPECTROSCOPY; VISIBLE SPECTRAL RANGE; XRD;

GLASS LASERS; LIGHT TRANSMISSION; NEAR INFRARED SPECTROSCOPY; OPTICAL PROPERTIES; PALLADIUM; PHOTORESISTS; POLARIZATION; PULSED LASER DEPOSITION; PULSED LASERS; SUBSTRATES; SURFACE ROUGHNESS; THIN FILMS; X RAY DIFFRACTION;

DEPOSITION;

EID: 77950864690     PISSN: 00303992     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optlastec.2010.02.007     Document Type: Article

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