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Volumn 616, Issue 2-3, 2010, Pages 241-245
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Simulation study of four-mirror alignment of advanced Kirkpatrick-Baez optics
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Author keywords
Full field X ray microscopy; Hard X ray imaging; Kirkpatrick Baez optics; Wolter optics; X ray mirror
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Indexed keywords
FULL-FIELD;
FULL-FIELD X-RAY MICROSCOPY;
HARD X-RAY IMAGING;
KIRKPATRICK-BAEZ;
X RAY MICROSCOPY;
X RAY MIRRORS;
ALIGNMENT;
INTERCONNECTION NETWORKS;
OPTOELECTRONIC DEVICES;
X RAY ANALYSIS;
X RAY MICROSCOPES;
X RAYS;
MIRRORS;
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EID: 77950810242
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nima.2009.09.124 Document Type: Article |
Times cited : (18)
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References (11)
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