Considerations on impedance matrix determination for accurate passive device characterization

Proceedings - 11th IEEE Workshop on Signal Propagation on Interconnects, SPI 2007

Volumn , Issue , 2007, Pages 117-120

  Wojnowski, M ^a   Engl, M ^a   Weigel, R ^b  

^a INFINEON TECHNOLOGIES AG   (Germany)

^b UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ERROR ESTIMATORS; IMPEDANCE MATRICES; MCM-D TECHNOLOGY; MEASUREMENT RESULTS; PASSIVE DEVICES; S-MATRIX; S-PARAMETERS; SI-BASED; Z MATRIX;

INTERCHANGES; METAL RECOVERY; PARAMETER EXTRACTION; TECHNICAL PRESENTATIONS;

SCATTERING PARAMETERS;

EID: 77950684283     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SPI.2007.4512226     Document Type: Conference Paper

References (9)

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