Lock-in thermography: A versatile tool for failure analysis of solar cells

Electronic Device Failure Analysis

Volumn 11, Issue 3, 2009, Pages 6-12

  Bauer, Jan ^a   Breitenstein, Otwin ^a   Wagner, Jan Martin ^a  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COOLED CAMERA; FAILURE POSITIONS; FRAME RATE; GERMANY; IMAGING TASK; INDIUM ANTIMONIDE; LOCK-IN; LOCKIN THERMOGRAPHY; QUALITATIVE AND QUANTITATIVE ANALYSIS; SOLAR CELL PARAMETERS; SPATIAL RESOLUTION; STIRLING; VERSATILE TOOLS;

CAMERAS; INDIUM ANTIMONIDES; QUALITY ASSURANCE; QUALITY CONTROL; REMOTE SENSING; SOLAR CELLS; THERMOGRAPHY (IMAGING); THERMOGRAPHY (TEMPERATURE MEASUREMENT);

FAILURE ANALYSIS;

EID: 77950610704     PISSN: 15370755     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (15)

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