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Journal of Applied Physics

Volumn 107, Issue 6, 2010, Pages

Simulations of photoconductivity and lifetime for steady state and nonsteady state measurements

(6) Schuler N a Hahn, T b Schmerler, S b Hahn, S a Dornich, K a Niklas, J R a

a Freiberg Instruments GmbH (Germany)

b TU BERGAKADEMIE FREIBERG (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER-PROFILE; COMPLEX DEFECTS; CONTACTLESS MEASUREMENT; LIFETIME MEASUREMENTS; MATERIAL QUALITY; MEASURING METHOD; MINORITY CARRIER; NONSTEADY STATE; NONUNIFORM; NUMERICAL SIMULATION; SHOCKLEY-READ-HALL MODELS; SIMULATION APPROACH; SIMULATION TOOL; STEADY STATE; THICK SAMPLES; TRAP PARAMETERS; TRAPPING EFFECTS;

COMPUTER SIMULATION; DEFECTS; METAL CASTINGS; NUMERICAL METHODS; PHOTOCONDUCTIVITY; TOOLS;

EXTRACTION;

EID: 77950608628 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3331628 Document Type: Conference Paper

Times cited : (21)

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