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Journal of Vacuum Science and Technology B

Volumn 28, Issue 2, 2010, Pages

Electron wave interference induced by electrons emitted from Pt field emitter fabricated by focused-ion-beam-induced deposition

(4) Murakami, K a Matsuo, T a Wakaya, F a Takai, M a

a OSAKA UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; ELECTRONS; FABRICATION; FIELD EMISSION; FOCUSED ION BEAMS; IONS;

ELECTRON WAVE INTERFERENCE; EMISSION PATTERN; FIELD EMISSION MICROSCOPY; FIELD EMITTER; FIELD ION MICROSCOPY; FOCUSED ION BEAM INDUCED DEPOSITION; MICROSCOPY IMAGES;

NANOCRYSTALS;

EID: 77950566503 PISSN: 21662746 EISSN: 21662754 Source Type: Journal
DOI: 10.1116/1.3333440 Document Type: Conference Paper

Times cited : (8)

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