Reflectance of polytetrafluoroethylene for xenon scintillation light

Journal of Applied Physics

Volumn 107, Issue 6, 2010, Pages

  Silva, C ^a   Pinto Da Cunha, J ^a   Pereira, A ^a   Chepel, V ^a   Lopes, M I ^a   Solovov, V ^a   Neves, F ^a  

^a UNIVERSITY OF COIMBRA   (Portugal)

Author keywords

[No Author keywords available]

Indexed keywords

DARK MATTER SEARCHES; DIFFERENT PROCESS; DIFFUSE REFLECTION; DOUBLE BETA DECAY; FLUORINATED ETHYLENE PROPYLENE; FLUORO-POLYMERS; LIQUID XENON; PHYSICAL MODEL; SCINTILLATION PHOTONS; TETRAFLUOROETHYLENE; VACUUM ULTRAVIOLETS; VUV LIGHT; WAVELENGTH REGIONS; XENON SCINTILLATION;

ALUMINA; ANGULAR DISTRIBUTION; ELEMENTARY PARTICLES; ETHYLENE; FLUORINE CONTAINING POLYMERS; LIGHT; LIGHT EMISSION; PHOTORESISTS; PROPYLENE; REFLECTION; SCINTILLATION;

XENON;

EID: 77950557356     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3318681     Document Type: Conference Paper

References (29)

1. G. J. Alner, H. M. Araujo, A. Bewick, C. Bungau, B. Camanzi, M. J. Carson, R. J. Cashmore, H. Chagani, V. Chepel, D. Cline, D. Davidge, J. C. Davies, E. Daw, J. Dawson, T. Durkin, B. Edwards, T. Gamble, J. Gao, C. Ghag, A. S. Howard, W. G. Jones, M. Joshi, E. V. Korolkova, V. A. Kudryavtsev, T. Lawson, V. N. Lebedenko, J. D. Lewin, P. Lightfoot, A. Lindote, I. Liubarsky, M. I. Lopes, R. Luscher, P. Majewski, K. Mavrokoridis, J. E. McMillan, B. Morgan, D. Muna, A. St. J. Murphy, F. Neves, G. G. Nicklin, W. Ooi, S. M. Paling, J. Pinto Da Cunha, S. J. S. Plank, R. M. Preece, J. J. Quenby, M. Robinson, G. Salinas, F. Sergiampietri, C. Silva, V. N. Solovov, N. J. T. Smith, P. F. Smith, N. J. C. Spooner, T. J. Sumner, C. Thorne, D. R. Tovey, E. Tziaferi, R. J. Walker, H. Wang, J. T. White, and F. L. H. Wolfs, Astropart. Phys. 28, 287 (2007). 10.1016/j.astropartphys.2007.06.002 (Pubitemid 47553088)
2. M. Danilov, R. DeVoe, A. Dolgolenko, G. Giannini, G. Gratta, P. Picchi, A. Piepke, F. Pietropaolo, P. Vogel, J. -L. Vuilleumier, Y. -F. Wang, and O. Zeldovich, Phys. Lett. B 0370-2693 480, 12 (2000). 10.1016/S0370-2693(00)00404-4
3. S. Ritt and the MEG Collaboration, Nucl. Phys. B 0550-3213 162, 279 (2006). 10.1016/j.nuclphysbps.2006.09.091 (Pubitemid 44774711)
4. T. Doke and K. Masuda, Nucl. Instrum. Methods Phys. Res. A 0168-9002 420, 62 (1999). 10.1016/S0168-9002(98)00933-4
5. P. Kadkhoda, D. Ristau, and F. von Alvensleben Proc. SPIE 0277-786X, 3578, 544, (1999). 10.1117/12.344390
6. V. R. Weidner and J. J. Hsia, J. Opt. Soc. Am. 0030-3941 71, 856 (1981). 10.1364/JOSA.71.000856
7. V. R. Weidner, J. J. Hsia, and B. Adams, Appl. Opt. 0003-6935 24, 2225 (1985). 10.1364/AO.24.002225
8. J. T. Bendler, S. F. Feldman, H. Hatti, and S. Y. Hobbs, J. Appl. Phys. 0021-8979 83, 998 (1998). 10.1063/1.366788
9. M. Yamashita, T. Doke, K. Kawasaki, J. Kikuchi, and S. Suzuki, Nucl. Instrum. Methods Phys. Res. A 0168-9002 535, 692 (2004). 10.1016/j.nima.204.06. 168
10. F. Neves, V. Chepel, V. Solovov, A. Pereira, M. I. Lopes, J. P. da Cunha, P. Mendes, A. Lindote, C. P. Silva, R. F. Marques, and A. J. P. L. Policarpo, IEEE Trans. Nucl. Sci. 0018-9499 52, 2793 (2005). 10.1109/TNS.2005.862782 (Pubitemid 43269673)
11. M. Miyajima, S. Sasaki, and E. Shibamura, Nucl. Instrum. Methods Phys. Res. B 0168-583X 63, 297 (1992). 10.1016/0168-583X(92)95113-6
12. D. Riedel and C. Castex, Appl. Phys. A: Mater. Sci. Process. 0947-8396 69, 375 (1999). 10.1007/s003390051017
13. H. EBNESAJJAD, Fluoroplastics, Non-Melt Processable Fluoroplastics Vol. 1 (Knovel, Norwich, New York, 2000).
14. C. Silva, J. P. da Cunha, A. Pereira, V. Chepel, M. I. Lopes, and V. Solovov, IEEE NSS Conference Record 2008 (IEEE, New York, 2008), pp. 1253.
15. C. Silva, J. P. da Cunha, V. Chepel, A. Pereira, V. Solovov, P. Mendes, F. Neves, and M. I. Lopes, Nucl. Instrum. Methods Phys. Res. A 0168-9002 580, 322 (2007). 10.1016/j.nima.2007.05.166 (Pubitemid 47331899)
16. L. B. Wolff, J. Opt. Soc. Am. 0030-3941 11, 2956 (1994). 10.1364/JOSAA.11.002956
17. Q. Zhu, H. Lee, and Z. M. Zhang, Front. Energy Power Eng. China 3, 60 (2009). 10.1007/s11708-009-0011-3 1673-7393
18. M. Oren and S. K. Nayar, " Generalization of Lambert's reflectance model.," in Proceedings of ACM SIGGRAPH (ACM, 1994), p. 239.
19. L. B. Wolff, S. K. Nayar, and M. Oren, Int. J. Comput. Vis. 0920-5691 30, 55 (1998). 10.1023/A:1008017513536
20. B. Walter, S. R. Marschner, H. Li, and K. E. Torrance, Geometrical Considerations and Nomenclature for Reflectance (National Bureau of Standards, Washington, D.C., 1977).
21. B. Smith, IEEE Trans. Antennas Propag. 0018-926X 15, 668 (1967). 10.1109/TAP.1967.1138991
22. S. K. Nayar, K. Ikeuchi, and T. Kanade, IEEE Trans. Pattern Anal. Mach. Intell. 0162-8828 13, 611 (1991). 10.1109/34.85654 (Pubitemid 21674677)
23. B. Walter, Eurographics Symposium on Rendering (Springer-Verlag, Berlin, 2007).
24. K. Torrance and E. Sparrow, J. Opt. Soc. Am. 0030-3941 57, 1105 (1967). 10.1364/JOSA.57.001105
25. T. Trowbridge and K. P. Reitz, J. Opt. Soc. Am. 0030-3941 65, 531 (1975). 10.1364/JOSA.65.000531
26. P. -S. Shaw, Z. Li, U. Arp, and K. R. Lykke, Appl. Opt. 0003-6935 46, 5119 (2007). 10.1364/AO.46.005119 (Pubitemid 47632069)
27. J. Huang, Mater. Chem. Phys. 0254-0584 68, 180 (2001). 10.1016/S0254-0584(00)00353-9 (Pubitemid 32077249)
28. T. Gumpenberger, J. Heitz, D. Bäuerle, and T. C. Rosenmayer, Europhys. Lett. 0295-5075 70, 831 (2005). 10.1209/epl/i2005-10037-y (Pubitemid 40855261)
29. L. Ferry, G. Vigier, R. Alexander-Katz, and C. Garapon, J. Polym. Sci., Part B: Polym. Phys. 0887-6266 36, 2057 (1998). 10.1002/(SICI)1099- 0488(19980915)36:12<2057::AID-POLB5>3.0.CO;2-U