Measuring the angular profile of the reflection of xenon scintillation light

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 580, Issue 1 SPEC. ISS., 2007, Pages 322-325

  Silva, C P ^a   Pinto da Cunha, J ^a   Chepel, V ^a   Pereira, A ^a   Solovov, V ^a   Mendes, P ^a   Neves, F ^a   Lopes, M I ^a  

^a UNIVERSITY OF COIMBRA   (Portugal)

Author keywords

Liquid xenon; PTFE; Reflectance; VUV; Xenon scintillation

Indexed keywords

ANGULAR DISTRIBUTION; COPPER; POLYTETRAFLUOROETHYLENES; REFLECTION; SCINTILLATION; XENON;

ANGULAR PROFILES; LIQUID XENON; ULTRAVIOLET VACUUM LIGHT; XENON SCINTILLATION;

LIGHT;

EID: 34548251998     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2007.05.166     Document Type: Article

References (7)

1. Lopes M.I., and Chepel V. IEEE Trans. Dielectr. Electr. Insul. 10 (2003) 994
2. Chepel V., et al. Astroparticle Phys. 26 1 (2006) 58
3. Weidner, et al. J. Opt. Soc. Am. 71 7 (1981) (Appendix G)
4. Schwentner X., et al. Springer Tracks in Modern Physics (1985), Springer, Berlin
5. Michael B., et al. Handbook of Optics vol. II (1995), McGraw-Hill, New York p. 33.23
6. The sample used is referred to as ref. FP303050 in the GoodFellow's catalogue 2006.
7. Nayar S.K., et al. IEEE Trans. Pattern Anal. Mach. Intell. 13 7 (1991) 611