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Volumn , Issue , 2008, Pages 1253-1258

Reflection of the xenon scintillation light from polytetrafluoroethylene (PTFE)

Author keywords

[No Author keywords available]

Indexed keywords

DARK MATTER SEARCHES; DIFFERENT PROCESS; DIFFUSE REFLECTION; DOUBLE BETA DECAY; FLUORO-POLYMERS; LIQUID XENON; PHYSICAL MODEL; SCINTILLATION PHOTONS; WAVELENGTH REGIONS; XENON SCINTILLATION;

EID: 67649237014     PISSN: 10957863     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NSSMIC.2008.4774633     Document Type: Conference Paper
Times cited : (1)

References (20)
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    • Journ G. Alner et al, Astroparticle Physics, Vol.28, Issue 3, November 2007, Pages 287-302
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  • 3
    • 67649187082 scopus 로고    scopus 로고
    • MEG Collaboration
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    • Nucl. Instr. Meh. , vol.A 503 , Issue.203 , pp. 290
  • 4
    • 0019590245 scopus 로고
    • Appendix G
    • Weidner, et al., Journ. Opt. Soc. Am. Vol.71 No.7/ Appendix G (1981)
    • (1981) Journ. Opt. Soc. Am. , vol.71 , Issue.7
    • Weidner1
  • 5
    • 67649137524 scopus 로고    scopus 로고
    • C.P.Silva, et al, NIM A Vol. 580, Is.l 322 (2007)
    • (2007) NIM A , vol.580 , pp. 322
    • Silva, C.P.1
  • 6
    • 0003881170 scopus 로고
    • 2. ed McGraw Hill
    • Michael Bass, Handbook of Optics Vol. II, 2. ed McGraw Hill (1995)
    • (1995) Handbook of Optics , vol.II
    • Bass, M.1
  • 7
    • 0003216549 scopus 로고
    • Geometrical considerations and nomenclature for reflectance
    • Department of Commerce, Washington, D.C.
    • F.E. Nicodemus et. al, Geometrical Considerations and Nomenclature for Reflectance, National Bureau of Standards, Department of Commerce, Washington, D.C. 20234 (1977)
    • (1977) National Bureau of Standards , pp. 20234
    • Nicodemus, F.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.