메뉴 건너뛰기




Volumn 46, Issue 22, 2007, Pages 5119-5128

Ultraviolet characterization of integrating spheres

Author keywords

[No Author keywords available]

Indexed keywords

DEUTERIUM COMPOUNDS; LASER BEAMS; MONOCHROMATORS; SPECTRUM ANALYSIS; ULTRAVIOLET RADIATION; WAVELENGTH;

EID: 35448969689     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.46.005119     Document Type: Article
Times cited : (30)

References (22)
  • 1
    • 84975564140 scopus 로고
    • Spectral irradiance measurements: Effect of UV-produced fluorescence in integrating spheres
    • R. D. Saunders and W. R. Ott, "Spectral irradiance measurements: effect of UV-produced fluorescence in integrating spheres," Appl. Opt. 15, 827-827 (1976).
    • (1976) Appl. Opt , vol.15 , pp. 827-827
    • Saunders, R.D.1    Ott, W.R.2
  • 2
    • 0019590245 scopus 로고
    • Reflection properties of pressed polytetrafluoroethylene powder
    • V. R. Weidner and J. J. Hsia, "Reflection properties of pressed polytetrafluoroethylene powder," J. Opt. Soc. Am. 71, 856-861 (1981).
    • (1981) J. Opt. Soc. Am , vol.71 , pp. 856-861
    • Weidner, V.R.1    Hsia, J.J.2
  • 3
    • 0001730984 scopus 로고
    • Ultraviolet stability and contamination analysis of Spectralon diffuse reflectance material
    • A. E. Stiegman, C. J. Bruegge, and A. W. Springsteen, "Ultraviolet stability and contamination analysis of Spectralon diffuse reflectance material," Opt. Eng. 32, 799-804 (1993).
    • (1993) Opt. Eng , vol.32 , pp. 799-804
    • Stiegman, A.E.1    Bruegge, C.J.2    Springsteen, A.W.3
  • 4
    • 0000840160 scopus 로고
    • Use of Spectralon as a diffuse reflectance standard for in-flight calibration of earth-orbiting sensors
    • C. J. Bruegge, A. E. Stiegman, R. A. Rainen, and A. W. Springsteen, "Use of Spectralon as a diffuse reflectance standard for in-flight calibration of earth-orbiting sensors," Opt. Eng. 32, 805-814 (1993).
    • (1993) Opt. Eng , vol.32 , pp. 805-814
    • Bruegge, C.J.1    Stiegman, A.E.2    Rainen, R.A.3    Springsteen, A.W.4
  • 5
    • 0030146525 scopus 로고
    • Ageing of materials under intense UV radiation
    • D. R. Gibbs, F. J. Duncan, R. P. Lambe, and T. M. Goodman, "Ageing of materials under intense UV radiation," Metrologia 32, 601-607 (1995/1996).
    • (1995) Metrologia , vol.32 , pp. 601-607
    • Gibbs, D.R.1    Duncan, F.J.2    Lambe, R.P.3    Goodman, T.M.4
  • 6
    • 0001589606 scopus 로고    scopus 로고
    • Reflectance properties of pressedAlgoflon F6: A replacement reflectance-standard material for Halon
    • P. R. Spyak and C. Lansard, "Reflectance properties of pressedAlgoflon F6: a replacement reflectance-standard material for Halon," Appl. Opt. 36, 2963-2970 (1997).
    • (1997) Appl. Opt , vol.36 , pp. 2963-2970
    • Spyak, P.R.1    Lansard, C.2
  • 7
    • 0037226251 scopus 로고    scopus 로고
    • Degradation of the diffuse reflectance of Spectralon under low-level irradiation
    • W. Möller, K.-P. Nikolaus, and A. Hope, "Degradation of the diffuse reflectance of Spectralon under low-level irradiation," Metrologia 40, S212-S215 (2003).
    • (2003) Metrologia , vol.40
    • Möller, W.1    Nikolaus, K.-P.2    Hope, A.3
  • 8
    • 84893994170 scopus 로고    scopus 로고
    • H. J. Kostkowski, Reliable Spectroradiometry (Spectroradiometry Consulting, 1997), Appendix B.
    • H. J. Kostkowski, Reliable Spectroradiometry (Spectroradiometry Consulting, 1997), Appendix B.
  • 9
    • 0033308670 scopus 로고    scopus 로고
    • Reflectance standards at ultraviolet wavelength
    • P. Y. Barnes, M. E. Nadal, and E. A. Early, "Reflectance standards at ultraviolet wavelength," Proc. SPIE 3818, 9-14 (1999).
    • (1999) Proc. SPIE , vol.3818 , pp. 9-14
    • Barnes, P.Y.1    Nadal, M.E.2    Early, E.A.3
  • 12
    • 33845957086 scopus 로고    scopus 로고
    • Facility for spectral irradiance and radiance responsivity calibrations using uniform sources
    • S. W. Brown, G. P. Eppeldauer, and K. R. Lykke, "Facility for spectral irradiance and radiance responsivity calibrations using uniform sources," Appl. Opt. 45, 8218-8237 (2006).
    • (2006) Appl. Opt , vol.45 , pp. 8218-8237
    • Brown, S.W.1    Eppeldauer, G.P.2    Lykke, K.R.3
  • 14
    • 33645528279 scopus 로고    scopus 로고
    • Simple spectral stray light correction method for array spectroradiometers
    • Y. Zong, S. W. Brown, B. C. Johnson, K. R. Lykke, and Y. Ohno, "Simple spectral stray light correction method for array spectroradiometers," Appl. Opt. 45, 1111-1119 (2006).
    • (2006) Appl. Opt , vol.45 , pp. 1111-1119
    • Zong, Y.1    Brown, S.W.2    Johnson, B.C.3    Lykke, K.R.4    Ohno, Y.5
  • 15
    • 84893999000 scopus 로고    scopus 로고
    • Certain commercial equipment, instruments, or materials are identified in this paper to foster understanding. Such identification does not imply recommendation or endorsement by the National Institute of Standards and Technology, nor does it imply that the materials or equipment identified are necessarily the best available for the purpose
    • Certain commercial equipment, instruments, or materials are identified in this paper to foster understanding. Such identification does not imply recommendation or endorsement by the National Institute of Standards and Technology, nor does it imply that the materials or equipment identified are necessarily the best available for the purpose.
  • 16
    • 35449004572 scopus 로고    scopus 로고
    • On-line supercritical fluid extraction synchronous luminescence spectroscopy: A screening method for polycyclic aromatic hydrocarbons
    • and references therein. See, for example
    • See, for example, D. Cox, J. M. Key, M. S. Lai, J. R. Sutherland, M. R. Zahn, and J. M. Arrington, "On-line supercritical fluid extraction synchronous luminescence spectroscopy: a screening method for polycyclic aromatic hydrocarbons," J. Under. Chem. Res. 2, 39-42 (2005) and references therein.
    • (2005) J. Under. Chem. Res , vol.2 , pp. 39-42
    • Cox, D.1    Key, J.M.2    Lai, M.S.3    Sutherland, J.R.4    Zahn, M.R.5    Arrington, J.M.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.