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Volumn 64, Issue 1, 2008, Pages 232-245

The MEM/Rietveld method with nano-applications - Accurate charge-density studies of nano-structured materials by synchrotron-radiation powder diffraction

Author keywords

Charge density; Maximum entropy method; Metallofullerene; Nano material; Porous coordination polymers; Powder diffraction; Synchrotron radiation

Indexed keywords


EID: 37549070396     PISSN: 01087673     EISSN: 16005724     Source Type: Journal    
DOI: 10.1107/S010876730706521X     Document Type: Review
Times cited : (58)

References (71)
  • 59
    • 33645467199 scopus 로고    scopus 로고
    • Takaoka, K., Kawano, M., Ozeki, T. & Fujita, M. (2006). Chem. Commun. pp. 1625-1627.y
    • Takaoka, K., Kawano, M., Ozeki, T. & Fujita, M. (2006). Chem. Commun. pp. 1625-1627.y


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.