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Volumn 52, Issue 2, 1996, Pages 287-290

The influence of the completeness of the data set on the charge density obtained with the maximum-entropy method. A re-examination of the electron-density distribution in Si

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001294738     PISSN: 01087673     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108767395014917     Document Type: Article
Times cited : (44)

References (19)
  • 6
    • 0000192771 scopus 로고
    • Jauch, W. (1994). Acta Cryst A50, 650-652.
    • (1994) Acta Cryst , vol.A50 , pp. 650-652
    • Jauch, W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.