Thin film femtosecond laser damage competition

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7504, Issue , 2009, Pages

  Stolz, Christopher J ^a   Ristau, Detlev ^b   Turowski, Marcus ^b   Blaschke, Holger ^b  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b LASER ZENTRUM HANNOVER E V   (Germany)

Author keywords

Damage testing; Femtosecond laser; Mirror; Multilayer; Thin film

Indexed keywords

BLIND TEST; COATING MATERIAL; CURRENT STATUS; DAMAGE TESTING; DAMAGE TESTS; DEPOSITION PROCESS; FEMTO-SECOND LASER; FEMTOSECONDS; GOVERNMENT SECTORS; HIGH REFLECTOR; LASER RESISTANCE; MULTI-LAYER THIN FILM; NORMAL INCIDENCE; PULSE LENGTH; STATE OF THE ART; THIN FILM LASER;

COATINGS; COMPETITION; FILM PREPARATION; LASER DAMAGE; MULTILAYERS; OPTICAL MATERIALS; OPTICAL TESTING; PULSED LASER APPLICATIONS; THIN FILM DEVICES; ULTRASHORT PULSES;

MIRRORS;

EID: 77949898344     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.837473     Document Type: Conference Paper

References (8)

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