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Volumn 5273, Issue , 2004, Pages 388-395

Results of a Round-robin experiment in multiple-pulse LIDT measurement with ultrashort pulses

Author keywords

CHOCLAB; ISO 11254 2; Multiple pulse damage; Round robin experiment; S on 1 LIDT

Indexed keywords

CALORIMETRY; CHARACTERIZATION; DIELECTRIC MATERIALS; MIRRORS; OPTICAL MATERIALS; ULTRASHORT PULSES;

EID: 5544265278     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.525135     Document Type: Conference Paper
Times cited : (23)

References (13)
  • 5
    • 5544292834 scopus 로고    scopus 로고
    • Damage threshold measurements of gold and dielectric coated optical components at 50fs-5ns
    • Friedrich Schiller-Universität Jena, Institut für Optik und Quantenelektronik. Annual Report
    • R. Bödefeld, W. Theobald, J. Schreiber, H. Gessner, E. Welsch, T. Feurer, and R. Sauerbrey. Damage threshold measurements of gold and dielectric coated optical components at 50fs-5ns. Technical report, Friedrich Schiller-Universität Jena, Institut für Optik und Quantenelektronik, 1999. Annual Report.
    • (1999) Technical Report
    • Bödefeld, R.1    Theobald, W.2    Schreiber, J.3    Gessner, H.4    Welsch, E.5    Feurer, T.6    Sauerbrey, R.7
  • 6
    • 0033100822 scopus 로고    scopus 로고
    • Precise laser ablation of dielectrics in the 10-fs regime
    • M. Lenzner, J. Kr̈ger, W. Kautek, and F. Krausz. Precise laser ablation of dielectrics in the 10-fs regime. Appl. Phys. A, 68:369-371, 1999.
    • (1999) Appl. Phys. A , vol.68 , pp. 369-371
    • Lenzner, M.1    Kr̈ger, J.2    Kautek, W.3    Krausz, F.4
  • 9
    • 5544277116 scopus 로고    scopus 로고
    • Test methods for laser induced damage threshold of optical surfaces. Part 2: S on 1 test
    • ISO 11254-2. International Organization for Standardization
    • ISO 11254-2: Test methods for laser induced damage threshold of optical surfaces. Part 2: S on 1 test. International Standard, 2001. International Organization for Standardization.
    • (2001) International Standard
  • 10
  • 12
    • 84975633474 scopus 로고
    • Simple technique for measurement of pulsed gaussian-beam spot sizes
    • J.M. Liu. Simple technique for measurement of pulsed gaussian-beam spot sizes. Opt. Lett., 7(5):196-198, 1982.
    • (1982) Opt. Lett. , vol.7 , Issue.5 , pp. 196-198
    • Liu, J.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.