XPS and XAES of polyethylenes aided by line shape analysis: The effect of electron irradiation

Polymer Degradation and Stability

Volumn 94, Issue 10, 2009, Pages 1714-1721

  Lesiak, B ^a   Zemek, J ^b   Houdkova, J ^b   Jiricek, P ^b   Jozwik A ^c,d  

^a INSTITUTE OF PHYSICAL CHEMISTRY   (Poland)

^b INSTITUTE OF PHYSICS   (Czech Republic)

^c INSTITUTE OF BIOCYBERNETICS AND BIOMEDICAL ENGINEERING   (Poland)

^d LODZ UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Electron beam degradation; Line shape analysis; Polyethylene; XAES; XPS

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; ELECTRON BEAMS; ELECTRON IRRADIATION; ELECTRON SPECTROSCOPY; ELECTRON TRANSITIONS; ELECTRONS; IRRADIATION; PATTERN RECOGNITION; PHOTODEGRADATION; POLYETHYLENES;

AVERAGE INFORMATION; ELECTRON BEAM IRRADIATION; FUZZY K NEAREST NEIGHBOR (FKNN); LINE SHAPE ANALYSIS; SURFACE DEGRADATION; ULTRA-HIGH MOLECULAR WEIGHT; X-RAY INDUCED AUGER ELECTRON SPECTROSCOPIES; XAES;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 77949878976     PISSN: 01413910     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.polymdegradstab.2009.06.014     Document Type: Article

References (22)

1. Baer DR, Gaspar DJ, Engelhard MH, Lea AS. Beam effects during AES and XPS analysis in surface analysis by Auger and X-ray photoelectron spectroscopy. In: Briggs D, Grant JT, editors. UK: IM Publications and Surface Spectra Limited; 2003 [chapter 9].
2. Díaz J, Paolicelli G, Ferrer S, Comin F. Phys Rev B 1996;54:8064-9.
3. Taki Y, Takai O. Thin Solid Films 1998;316:45-50.
4. Merel P, Tabbal M, Chaker M, Moisa S, Margot J. Appl Surf Sci 1998;136:105-10.
5. Mizokawa T, Miyasato T, Nakamura KM, Geib KM, Wilmsen CW. J Vac Sci Technol A 1987;5:2809-13.
6. Lascovich JC, Giorgi R, Scaglione S. Appl Surf Sci 1991;46:17-21.
7. Titantah JT, Lamoen D. Carbon 2005;43:1311-6.
8. Zemek J, Houdkova J, Lesiak B, Jablonski A, Potmesil J, Vanecek MJ. Optoelectronics Adv Mater 2006;8:2133-8.
9. Popov C, Kulisch W, Bliznakov S, Mednikarov B, Spasov G, Pirov J, et al. Appl Phys A 2007;89:209-12.
10. Turgeon S, Paynter RW. Thin Solid Films 2001;394:44-8.
11. Lesiak B, Zemek J, Houdkova J, Vanecek M, Jó źwik A, in preparation.
12. Fix E, Hodges JL. Project 21-49-004. Report number 11. USAF School of Aviation Medicine, Randolpf Field, Texas, 1952, p. 280.
13. Bezdek JC, Chuah SK, Leep D. Fuzzy Sets Syst 1986;18:237-56.
14. Kwok RWM, XPS peak fitting program for WIN95/98 XPSPEAK version 4.1, Department of Chemistry, The ChineseUniversity ofHongKong, rmkwok@cuhk. edu.hk; http://www.phy.cuhk.edu.hk/-surface/XPSPEAK/index.html; 2008.
15. Jablonski A, Powell CJ. Surf Sci 2005;551:106-24.
16. Standard E 673-01. Annual book of ASTM standards 2002.West Conshohocken, PA: ASTM International; 2002, vol. 3.06, p. 755.
17. Jablonski A, Tilinin IS, Powell CJ. Phys Rev B 1996;54:10927-37.
18. Powell CJ, Jablonski A. NIST electron inelastic-mean-free-path database (SRD 71), v. 1.1. Gaithersburg, MD: NIST; 2000.
19. Wikipedia, the free Encyclopedia; http://en.wikipedia.org/wiki/ polyethylene; 2009.
20. Švorčík V, Kolářová K, Slepička P, Macková A, Novotná M, Hnatowicz V. Polym Degrad Stab 2006;91:1219-25.
21. El-Sayed SM, Arnaouty MB, Fayek SA. Polym Test 2003;22:17-23.
22. Rizk RAM, Abdul-Kader AM, Ali ZI, Ali M. Vacuum 2009;83:805-8.