Electron spectroscopy of nanocrystalline diamond surfaces

Journal of Optoelectronics and Advanced Materials

Volumn 8, Issue 6, 2006, Pages 2133-2138

  Zemek, J ^a   Houdkova, J ^a   Lesiak, B ^b   Jablonski, A ^b   Potmesil, J ^a   Vanecek, M ^a  

^a INSTITUTE OF PHYSICS   (Czech Republic)

^b POLISH ACADEMY OF SCIENCES   (Poland)

Author keywords

Electron microscopy; Electronic structure; Nanocrystalline diamond film; Surface properties; X ray photoelectron spectroscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON FILMS; DIAMOND FILMS; ELECTRON ENERGY LEVELS; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELECTRON TRANSPORT PROPERTIES; ELECTRONIC STRUCTURE; PHOTOELECTRONS; PHOTONS; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTIES; X RAY PHOTOELECTRON SPECTROSCOPY;

CALCULATED IMFP; ELASTIC BACKSCATTERING; ELASTIC PEAK ELECTRON SPECTROSCOPY; ELECTRON ENERGY RANGE; ELECTRON TRANSPORT; INELASTIC MEAN FREE PATH; NANO-CRYSTALLINE DIAMONDS; NANOCRYSTALLINE DIAMOND FILMS;

NANOCRYSTALS;

EID: 33845623354     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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