Smart-flooding: A novel scheme for fault-tolerant NoCs

Proceedings - IEEE International SOC Conference, SOCC 2009

Volumn , Issue , 2009, Pages 259-262

  Sanusi, Azeez ^a   Bayoumi, Magdy A ^a  

^a University of Louisiana at Lafayette   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHIP YIELD; DEEP SUB-MICRON; DEVICE SIZES; FAULT-TOLERANT; FLOODING ALGORITHMS; IN-NETWORK; NOISE SOURCE; PERMANENT FAULTS; PROCESS VARIATION; RETRANSMISSIONS; TRANSIENT AND PERMANENT FAULT; TRANSIENT ERRORS;

BIOLOGICAL MATERIALS; FAULT TOLERANCE; PROGRAMMABLE LOGIC CONTROLLERS;

QUALITY ASSURANCE;

EID: 77949648043     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SOCCON.2009.5398046     Document Type: Conference Paper

References (7)

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7. G. De Micheli, "Robust System Design with Uncertain Information," Keynote Speech, ASPDAC, Kitakyushu, Japan , January 2003.