Predicting voltage droops using recurring program and microarchitectural event activity

IEEE Micro

Volumn 30, Issue 1, 2010, Pages 101-109

  Reddi, Vijay Janapa ^a   Gupta, Meeta ^a   Holloway, Glenn ^a   Smith, Michael D ^a   Wei, Gu Yeon ^a   Brooks, David ^a  

^a HARVARD UNIVERSITY   (United States)

Author keywords

DI dt; Fault tolerance; Inductive noise; Performance; Reliability; Voltage emergencies; Voltage noise

Indexed keywords

INDUCTIVE NOISE; SHRINKING FEATURE SIZES; SUPPLY VOLTAGES; SUPPLY-VOLTAGE FLUCTUATION; VOLTAGE DROOP; VOLTAGE EMERGENCIES; VOLTAGE FLUCTUATIONS; VOLTAGE NOISE;

FAULT TOLERANCE; PROGRAM PROCESSORS; VOLTAGE CONTROL;

QUALITY ASSURANCE;

EID: 77949628649     PISSN: 02721732     EISSN: None     Source Type: Journal    
DOI: 10.1109/MM.2010.25     Document Type: Article

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