Full vectorial imaging of electromagnetic light at subwavelength scale

Optics Express

Volumn 18, Issue 6, 2010, Pages 5809-5824

  Grosjean, T ^a   Ibrahim, I A ^a   Suarez, M A ^a   Burr, G W ^b   Mivelle, M ^a   Charraut, D ^a  

^a UNIVERSITÉ DE FRANCHE COMTÉ   (France)

^b IBM ALMADEN RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MAGNETIC FIELDS; METAMATERIALS; NUMERICAL METHODS; OPTICAL INSTRUMENTS; TWO DIMENSIONAL;

AMPLITUDE DISTRIBUTIONS; ELECTRIC AND MAGNETIC FIELDS; ENERGY FLOW; EXPERIMENTAL ANALYSIS; NANO-DEVICES; NANO-OPTICAL DEVICES; NEAR FIELD IMAGING; NEAR-FIELD; OPTICAL EFFECTS; POYNTING VECTOR DISTRIBUTIONS; SAMPLE SURFACE; SUBWAVELENGTH SCALE; THREE DIMENSIONS; TWO-COMPONENT;

FERROELECTRIC MATERIALS;

NANOMATERIAL;

ARTICLE; CHEMICAL MODEL; CHEMISTRY; COMPUTER SIMULATION; ELECTROMAGNETIC FIELD; LIGHT; RADIATION SCATTERING; ULTRASTRUCTURE;

COMPUTER SIMULATION; ELECTROMAGNETIC FIELDS; LIGHT; MODELS, CHEMICAL; NANOSTRUCTURES; SCATTERING, RADIATION;

EID: 77949596129     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.18.005809     Document Type: Article

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