Collection of transverse and longitudinal fields by means of apertureless nanoprobes with different metal coating characteristics

Applied Physics Letters

Volumn 85, Issue 22, 2004, Pages 5340-5342

  Descrovi, E ^a   Vaccaro, L ^a   Nakagawa, W ^a   Aeschimann, L ^a,b   Staufer, U ^a   Herzig, H P ^a  

^a UNIVERSITY OF NEUCHÂTEL   (Switzerland)

^b CSEM   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

COATED MATERIALS; DIELECTRIC MATERIALS; ELECTRIC FIELDS; LENSES; LIGHT EMISSION; LIGHT POLARIZATION; NEAR FIELD SCANNING OPTICAL MICROSCOPY; PHOTOMULTIPLIERS; SURFACE ROUGHNESS; THICKNESS MEASUREMENT; TRANSMISSION ELECTRON MICROSCOPY;

METAL COATINGS; MICROFABRICATION; OPTICAL FIELDS; WAVELENGTH;

NANOSTRUCTURED MATERIALS;

EID: 11044226565     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1827925     Document Type: Article

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