Plasmonic light beaming manipulation and its detection using holographic microscopy

IEEE Journal of Quantum Electronics

Volumn 46, Issue 3, 2010, Pages 300-305

  Lim, Yongjun ^a   Hahn, Joonku ^a   Kim, Seyoon ^a   Park, Junghyun ^a   Kim, Hwi ^b   Lee, Byoungho ^a  

^a Seoul National University   (South Korea)

^b SAMSUNG Electronics   (South Korea)

Author keywords

Index terms holographic interferometry; Pasmonics; Srface plasmons

Indexed keywords

DIELECTRIC GRATING; FAR-FIELD; HOLOGRAPHIC MICROSCOPY; INDEX TERMS; INDEX TERMS-HOLOGRAPHIC INTERFEROMETRY; LIGHT PATH; METALLIC SLITS; NEAR-FIELD; OFF-AXIS; OPTICAL INTERCONNECTIONS; PASMONICS; PHASE-SHIFT INTERFEROMETER; PLASMONIC DEVICES; PLASMONICS;

OPTICAL DATA PROCESSING; OPTICAL DATA STORAGE; OPTICAL INTERCONNECTS; PLASMONS;

HOLOGRAPHIC INTERFEROMETRY;

EID: 77949446351     PISSN: 00189197     EISSN: None     Source Type: Journal    
DOI: 10.1109/JQE.2009.2033717     Document Type: Article

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