Extended focused imaging of a microparticle field with digital holographic microscopy

Optics Letters

Volumn 33, Issue 14, 2008, Pages 1626-1628

  Antkowiak, Maciej ^a   Callens, Natacha ^a   Yourassowsky, Catherine ^a   Dubois, Frank ^a  

^a UNIVERSITÉ LIBRE DE BRUXELLES   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

MICROSCOPIC EXAMINATION;

AMPLITUDE MODULUS; DETERMINATION METHODS; DIGITAL HOLOGRAPHIC MICROSCOPY; NUMERICAL TECHNIQUES; OVERLAPPING WINDOW; SYNTHETIC IMAGES; THREE DIMENSIONAL LOCALIZATION; THREE-DIMENSIONAL ANALYSIS;

HOLOGRAPHY;

EID: 48249103617     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.33.001626     Document Type: Article

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