Electronic properties of ultrananocrystalline diamond surfaces

Applied Physics Letters

Volumn 96, Issue 9, 2010, Pages

  Lud, Simon Q ^a   Niedermeier, Martin ^a   Koch, Philipp S ^a   Bruno, Paola ^b   Gruen, Dieter M ^b   Stutzmann, Martin ^a   Garrido, Jose A ^a  

^a WALTER SCHOTTKY INSTITUT   (Germany)

^b ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; CARBON PHASE; DENSE MONOLAYERS; GRAIN SURFACE; H-TERMINATED SURFACE; PLASMA FUNCTIONALIZATION; PLASMA TREATMENT; SCANNING TUNNELING MICROSCOPY (STM); SCANNING TUNNELING SPECTROSCOPY; SURFACE BANDS; SURFACE ELECTRONIC PROPERTIES; SURFACE FUNCTIONALIZATION; SURFACE TERMINATION; ULTRA-NANOCRYSTALLINE DIAMOND; ULTRANANOCRYSTALLINE DIAMOND FILMS; XPS;

ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; DIAMOND FILMS; ELECTRONIC PROPERTIES; ELECTRONIC STRUCTURE; FLUORINE; GRAIN BOUNDARIES; MONOLAYERS; OXYGEN; PLASMA APPLICATIONS; SCANNING ELECTRON MICROSCOPY; SCANNING TUNNELING MICROSCOPY; WIND TUNNELS; X RAY PHOTOELECTRON SPECTROSCOPY;

SURFACE MORPHOLOGY;

EID: 77949395218     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3340898     Document Type: Article

References (28)

1. D. M. Gruen, Annu. Rev. Mater. Sci. ARMSCX 0084-6600 29, 211 (1999). 10.1146/annurev.matsci.29.1.211
2. P. Zapol, M. Sternberg, L. A. Curtiss, T. Frauenheim, and D. M. Gruen, Phys. Rev. B PRBMDO 0163-1829 65, 045403 (2001). 10.1103/PhysRevB.65.045403
3. P. Achatz, O. A. Williams, P. Bruno, D. M. Gruen, J. A. Garrido, and M. Stutzmann, Phys. Rev. B PRBMDO 0163-1829 74, 155429 (2006). 10.1103/PhysRevB.74. 155429
4. S. Q. Lud, M. Steenackers, R. Jordan, P. Bruno, D. M. Gruen, P. Feulner, J. A. Garrido, and M. Stutzmann, J. Am. Chem. Soc. JACSAT 0002-7863 128, 16884 (2006). 10.1021/ja0657049
5. J. Hernando, S. Q. Lud, P. Bruno, D. M. Gruen, M. Stutzmann, and J. A. Garrido, Electrochim. Acta ELCAAV 0013-4686 54, 1909 (2009). 10.1016/j.electacta.2008.10.041
6. F. Benedic, M. B. Assouar, F. Mohasseb, O. Elmazria, P. Alnot, and A. Gicquel, Diamond Relat. Mater. DRMTE3 0925-9635 13, 347 (2004). 10.1016/j.diamond.2003.10.020
7. T. Ando, M. Nishitani-Gamo, R. E. Rawles, K. Yamamoto, M. Kamo, and Y. Sato, Diamond Relat. Mater. DRMTE3 0925-9635 5, 1136 (1996). 10.1016/0925-9635(96)00529-8
8. M. Schvartzman and S. J. Wind, Nanotechnology NNOTER 0957-4484 20, 145306 (2009). 10.1088/0957-4484/20/14/145306
9. J. Cui, J. Ristein, and L. Ley, Phys. Rev. Lett. PRLTAO 0031-9007 81, 429 (1998). 10.1103/PhysRevLett.81.429
10. J. Tersoff and D. R. Hamann, Phys. Rev. B PRBMDO 0163-1829 31, 805 (1985). 10.1103/PhysRevB.31.805
11. R. M. Feenstra, Surf. Sci. SUSCAS 0039-6028 299-300, 965 (1994). 10.1016/0039-6028(94)90710-2
12. J. A. Dagata and W. Tseng, Appl. Phys. Lett. APPLAB 0003-6951 62, 591 (1993). 10.1063/1.108865
13. J. Birrell, J. A. Carlisle, O. Auciello, D. M. Gruen, and J. M. Gibson, Appl. Phys. Lett. APPLAB 0003-6951 81, 2235 (2002). 10.1063/1.1503153
14. S. Bhattacharyya, O. Auciello, J. Birrell, J. A. Carlisle, L. A. Curtiss, A. N. Goyette, D. M. Gruen, A. R. Krauss, J. Schlueter, A. Sumant, and P. Zapol, Appl. Phys. Lett. APPLAB 0003-6951 79, 1441 (2001). 10.1063/1.1400761
15. M. Wilms, M. Kruft, G. Bermes, and K. Wandelt, Rev. Sci. Instrum. RSINAK 0034-6748 70, 3641 (1999). 10.1063/1.1149971
16. J. Llopis, Catal. Rev. CTRVBY 0008-7645 2, 161 (1969). 10.1080/01614946908066543
17. C. Schlaup, D. Friebel, P. Broekmann, and K. Wandelt, Surf. Sci. SUSCAS 0039-6028 602, 864 (2008). 10.1016/j.susc.2007.12.017
18. N. O. V. Plank, L. D. Jiang, and R. Cheung, Appl. Phys. Lett. APPLAB 0003-6951 83, 2426 (2003). 10.1063/1.1611621
19. M. Uda, K. Maeda, A. Koyama, and Y. Sasa, Phys. Rev. A PLRAAN 1050-2947 29, 1258 (1984). 10.1103/PhysRevA.29.1258
20. S. Tanuma, C. J. Powell, and D. R. Penn, Surf. Interface Anal. SIANDQ 0142-2421 17, 911 (1991). 10.1002/sia.740171304
21. W. S. M. Werner, Surf. Interface Anal. SIANDQ 0142-2421 23, 737 (1995). 10.1002/sia.740231103
22. S. Wang, V. M. Swope, J. E. Bulter, T. Feygelson, and G. M. Swain, Diamond Relat. Mater. DRMTE3 0925-9635 18, 669 (2009). 10.1016/j.diamond.2008. 11.033
23. T. Sasagawa and Z. X. Shen, J. Appl. Phys. JAPIAU 0021-8979 104, 073704 (2008). 10.1063/1.2986637
24. O. A. Williams, S. Curat, J. E. Gerbi, D. M. Gruen, and R. B. Jackman, Appl. Phys. Lett. APPLAB 0003-6951 85, 1680 (2004). 10.1063/1.1785288
25. M. Yeganeh, P. R. Coxon, A. C. Brieva, V. R. Dhanak, L. Siller, and Y. V. Butenko, Phys Rev B 75, 155404 (2007). 10.1103/PhysRevB.75.155404 0003-6951
26. K. P. Loh, X. N. Xie, Y. H. Lim, E. J. Teo, J. C. Zheng, and T. Ando, Surf. Sci. SUSCAS 0039-6028 505, 93 (2002). 10.1016/S0039-6028(02)01103-2
27. S. J. Sque, R. Jones, and P. R. Briddon, Phys. Rev. B PRBMDO 0163-1829 73, 085313 (2006). 10.1103/PhysRevB.73.085313
28. See supplementary material at http://dx.doi.org/10.1063/1.3340898 E-APPLAB-96-066009 for further XPS and AFM characterization.