Accelerated life testing on repairable systems

Proceedings of the Annual Reliability and Maintainability Symposium

Volumn , Issue , 2004, Pages 340-345

  Guérin, Fabrice ^a,b   Dumon, Bernard ^a,b   Lantieri, Pascal ^a,b  

^a UNIVERSITÉ D'ANGERS   (France)

^b ISTIA   (France)

Author keywords

Accelerated testing; Arrhenius; Peck; Poisson's process; Repairable system

Indexed keywords

ACTIVATION ENERGY; ATMOSPHERIC HUMIDITY; COMPUTER SIMULATION; FAILURE (MECHANICAL); MATHEMATICAL MODELS; PARAMETER ESTIMATION; POISSON DISTRIBUTION; PRODUCT DESIGN; REPAIR; THERMAL EFFECTS; WEIBULL DISTRIBUTION; ELECTRON EMISSION; FAILURE ANALYSIS; MAINTAINABILITY; QUALITY CONTROL; RELIABILITY;

ACCELERATED LIFE TESTING; ARRHENIUS MODELS; PECK MODELS; REPAIRABLE SYSTEMS;

RELIABILITY THEORY; ABILITY TESTING;

ACCELERATED TESTING; ARRHENIUS; PECK; POISSON'S PROCESS; REPAIRABLE SYSTEMS;

EID: 2342484371     PISSN: 0149144X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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