Predictive microscopic modeling of VECSELs

IEEE Journal of Quantum Electronics

Volumn 46, Issue 5, 2010, Pages 810-817

  Hader, Jörg ^a,b   Hardesty, Garrett ^a   Wang, Tsuei Lian ^a   Yarborough, Michael J ^a   Kaneda, Yushi ^a   Moloney, Jerome V ^a,b   Kunert, Bernardette ^c,d   Stolz, Wolfgang ^c,d   Koch, Stephan W ^c  

^a UNIVERSITY OF ARIZONA   (United States)

^b NONLINEAR CONTROL STRATEGIES INC   (United States)

^c PHILIPPS UNIVERSITY MARBURG   (Germany)

^d NAsP III/V GmbH   (Germany)

Author keywords

Charge carrier lifetime; Modeling; Photoluminescence; Reflection; Semiconductor lasers

Indexed keywords

CARRIER RECOMBINATION; FIT PARAMETERS; MATERIAL GAIN; MICROSCOPIC MODELING; MODELING; NONIDEAL; OPTICALLY PUMPED; OUTPUT CHARACTERISTICS; SPOT DIAMETER; VERTICAL EXTERNAL CAVITY SURFACE EMITTING LASER;

CARRIER LIFETIME; LASERS; OPTICALLY PUMPED LASERS; PHOTOLUMINESCENCE; PUMPING (LASER); PUMPS;

SEMICONDUCTOR LASERS;

EID: 77749320456     PISSN: 00189197     EISSN: None     Source Type: Journal    
DOI: 10.1109/JQE.2009.2035714     Document Type: Article

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