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Volumn 43, Issue 11, 2010, Pages

Characterization of the interface properties in a-Si : HHH/c-Si heterostructures by photoluminescence

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE SILICON WAFERS; ENERGETIC POSITION; EXCESS CARRIERS; HETEROSTRUCTURES; INTERFACE DEFECTS; INTERFACE PROPERTY; NUMERICAL MODELLING; PHOTOLUMINESCENCE MEASUREMENTS; QUASI-FERMI LEVEL; QUASI-FERMI LEVEL SPLITTING; SI LAYER; SOLAR CELL PROCESSING; SPLITTINGS; SYMMETRICAL STRUCTURE; VALENCE BAND EDGES;

EID: 77749283258     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/43/11/115102     Document Type: Article
Times cited : (13)

References (19)
  • 12
    • 77749341201 scopus 로고    scopus 로고
    • Rösch M 2003 PhD Thesis Carl von Ossietzky Universität Oldenburg, online at docserver.bis.uni-oldenburg.de/publikationen/dissertation/ 2003/roeexp03/pdf
    • (2003)
    • Rösch, M.1
  • 19
    • 77749336325 scopus 로고    scopus 로고
    • Froitzheim A 2003 PhD Thesis Philipps-Universität Marburg
    • (2003)
    • Froitzheim, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.