ToF-SIMS and XPS studies of the adsorption characteristics of a Zn-porphyrin on TiO2

Langmuir

Volumn 26, Issue 5, 2010, Pages 3531-3538

  Killian, Manuela S ^a   Gnichwitz, Jan Frederik ^a   Hirsch, Andreas ^a   Schmuki, Patrik ^a   Kunze, Julia ^a  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION CHARACTERISTIC; ADSORPTION TIME; CHEMISORPTION/PHYSISORPTION; DIRECT MEASURES; HYDROXYL-TERMINATED; MOLECULAR PEAKS; ORGANIC FILMS; PREPARATION CONDITIONS; PREPARATION TEMPERATURES; REACTION TEMPERATURE; SILANIZATIONS; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY; TIO; TOF SIMS; XPS; XPS SPECTRA;

ADSORPTION; CHEMISORPTION; FILM PREPARATION; MONOLAYERS; PORPHYRINS; SECONDARY ION MASS SPECTROMETRY; SILICON COMPOUNDS; SILICON OXIDES; THICK FILMS; TITANIUM; TITANIUM DIOXIDE; ZINC;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 77749249685     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la9032139     Document Type: Article

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