Atomic emission spectra diagnosis and electron density measurement of semiconductor bridge (SCB) plasma

Plasma Science and Technology

Volumn 12, Issue 1, 2010, Pages 49-52

  Feng, Hongyan ^a   Zhu, Shunguan ^a   Zhang, Lin ^a   Wan, Xiaoxia ^a   Li, Yan ^a   Shen, Ruiqi ^a  

^a NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

Electron density; Saha equation; SCB plasma; Stark broadening

Indexed keywords

ATOMIC EMISSION SPECTRA; ELECTRON DENSITIES; ELECTRON DENSITY DISTRIBUTION; EMISSION SPECTRUMS; LOCAL THERMODYNAMIC EQUILIBRIUM; PLASMA ELECTRON DENSITY; SAHA EQUATION; STARK BROADENINGS; STARK WIDTH; VISIBLE RANGE;

ATOMIC SPECTROSCOPY; CARRIER CONCENTRATION; ELECTRIC DISCHARGES; ELECTRON DENSITY MEASUREMENT; EMISSION SPECTROSCOPY; MAGNESIUM PRINTING PLATES; PLASMAS; STARK EFFECT;

ELECTRONS;

EID: 77649267261     PISSN: 10090630     EISSN: None     Source Type: Journal    
DOI: 10.1088/1009-0630/12/1/11     Document Type: Article

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