Identification of iron oxide phases in thin films grown on Al2O3(0 0 0 1) by Raman spectroscopy and X-ray diffraction

Surface Science

Volumn 604, Issue 7-8, 2010, Pages 679-685

  Lübbe, Maike ^a   Gigler, Alexander M ^a   Stark, Robert W ^a   Moritz, Wolfgang ^a  

^a UNIVERSITY OF MUNICH   (Germany)

Author keywords

Hematite; Iron oxide; Magnetite; Raman; Thin film growth; XRD

Indexed keywords

IRON OXIDE THIN FILMS; OXYGEN ATMOSPHERE; POST ANNEALING; RAMAN SPECTRUM; SUBSTRATE TEMPERATURE; TEMPERATURE RANGE; UNIT CELLS; XRD;

ANNEALING; ATMOSPHERIC TEMPERATURE; DIFFRACTION; FILM GROWTH; HEMATITE; MAGNETITE; OXIDE FILMS; OXIDE MINERALS; OXYGEN; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SULFUR COMPOUNDS; THIN FILM DEVICES; THIN FILMS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

IRON OXIDES;

EID: 77649232940     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2010.01.015     Document Type: Article

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