Positron annihilation study on thin-film composite pervaporation membranes: Correlation between polyamide fine structure and different interfacial polymerization conditions

Polymer

Volumn 51, Issue 6, 2010, Pages 1370-1376

  Huang, Shu Hsien ^b   Hung, Wei Song ^a   Liaw, Der Jang ^c   Tsai, Hui An ^d   Jiang, George J ^b   Lee, Kueir Rarn ^a   Lai, Juin Yih ^a  

^a CHUNG YUAN CHRISTIAN UNIVERSITY   (Taiwan)

^b NATIONAL ILAN UNIVERSITY   (Taiwan)

^c NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^d NANYA INSTITUTE OF TECHNOLOGY   (Taiwan)

Author keywords

Interfacial polymerization; Polyamide; Positron annihilation spectroscopy (PAS)

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; CHLORINE COMPOUNDS; COMPOSITE MEMBRANES; ELECTRONS; FREE VOLUME; MEMBRANES; PERVAPORATION; POLYAMIDES; POLYMERIZATION; POSITRON ANNIHILATION SPECTROSCOPY; POSITRONS; SCANNING ELECTRON MICROSCOPY; SOLUTIONS; THIN FILMS;

INTERFACIAL POLYMERIZATION; ISOPROPANOL AQUEOUS SOLUTIONS; PERVAPORATION MEMBRANES; PERVAPORATIVE SEPARATION; POSITRON ANNIHILATION SPECTROSCOPY (PAS); THIN FILM COMPOSITES; TRIETHYLENETETRAMINE; VOLUME CONCENTRATION;

FILM PREPARATION;

COMPOSITE; FILM; INTERFACIAL PROPERTY; MEMBRANE; POLYMERIZATION; STRUCTURAL PROPERTY; SYNTHETIC POLYAMIDE; TEMPERATURE EFFECT;

EID: 77649232924     PISSN: 00323861     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.polymer.2010.01.064     Document Type: Article

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