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Volumn 40, Issue 21, 2007, Pages 7542-7557

Free-volume depth profile of polymeric membranes studied by positron annihilation spectroscopy: Layer structure from interfacial polymerization

Author keywords

[No Author keywords available]

Indexed keywords

INTERFACIAL POLYMERIZATION; POROUS POLYACRYLONITRILE; TRIETHYLENETETRAAMINE; TRIMESOYL CHLORIDE;

EID: 35548999263     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma071493w     Document Type: Article
Times cited : (249)

References (75)
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    • For example, see: Principles and Applications of Positron and Positronium Chemistry; Jean, Y. C., Mallon, P. E., Schrader, D. M., Eds.; World Sci.: Singapore, 2003.
    • (2003) Principles and Applications of Positron and Positronium Chemistry
  • 31
    • 0004004240 scopus 로고
    • For example, see:, Dupasquier, A, Mills, A. P, Jr, Eds, ISO Press, Amsterdam
    • For example, see: Positron Spectroscopy of Solids; Dupasquier, A., Mills, A. P., Jr., Eds.; ISO Press, Amsterdam, 1993.
    • (1993) Positron Spectroscopy of Solids
  • 32
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    • For example, see
    • For example, see: Jean, Y. C. Microchem. J. 1990, 42, 72.
    • (1990) Microchem. J , vol.42 , pp. 72
    • Jean, Y.C.1
  • 48
    • 0004124717 scopus 로고    scopus 로고
    • Coleman, P, Ed, World Sci. Pub, Singapore
    • Positron Beams and Their Applications; Coleman, P., Ed.; World Sci. Pub.: Singapore, 2000.
    • (2000) Positron Beams and Their Applications
  • 51
    • 3042688088 scopus 로고    scopus 로고
    • Chen, H.; Zhang, R.; Li, Y.; Zhang, J.; Wu, Y. C.; R.; Sandreczki, T. C.; Mallon, P. E.; Suzuki, R.; Ohdaira, T.; Gu, X.; Nguyen, T.; Jean, Y. C. Mater. Sci. Forum 2004, 445-46, 274.
    • Chen, H.; Zhang, R.; Li, Y.; Zhang, J.; Wu, Y. C.; R.; Sandreczki, T. C.; Mallon, P. E.; Suzuki, R.; Ohdaira, T.; Gu, X.; Nguyen, T.; Jean, Y. C. Mater. Sci. Forum 2004, 445-46, 274.
  • 75
    • 35548952737 scopus 로고    scopus 로고
    • Van Veen, A.; Schut, H. H.; de Vries, J.; Hakvoort, H. A; IJpma, M. R. AIP Conf. Proc. 1990, 218, 171.
    • Van Veen, A.; Schut, H. H.; de Vries, J.; Hakvoort, H. A; IJpma, M. R. AIP Conf. Proc. 1990, 218, 171.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.