Structure of ultrathin Pd films determined by low-energy electron microscopy and diffraction

New Journal of Physics

Volumn 12, Issue , 2010, Pages

  Santos, B ^a,b   Puerta, J M ^c   Cerda, J I ^c   Herranz, T ^b   McCarty, K F ^d   De La Flguera, J ^a,b  

^a CENTRO DE MICROANÁLISIS DE MATERIALES   (Spain)

^b INSTITUTO DE QUÍMICA FÍSICA ROCASOLANO   (Spain)

^c INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

^d SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONS; ENERGY EFFICIENCY; LOW ENERGY ELECTRON DIFFRACTION; THICK FILMS; TUNGSTEN;

ELEVATED TEMPERATURE; IN-PLANE LATTICES; INTERLAYER SPACINGS; LATTICE-MATCHED; LOW ENERGY ELECTRON MICROSCOPY; STACKING SEQUENCE; SUBSTRATE TERRACES; TWIN BOUNDARIES;

ULTRATHIN FILMS;

EID: 77649113121     PISSN: 13672630     EISSN: None     Source Type: Journal    
DOI: 10.1088/1367-2630/12/2/023023     Document Type: Article

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