Spectromicroscopy of ultrathin Pd films on W(1 1 0):: Interplay of morphology and electronic structure

Applied Surface Science

Volumn 238, Issue 1-4 SPEC. ISS., 2004, Pages 138-142

  Aballe, L ^a   Barinov, A ^a   Locatelli, A ^a   Heun, S ^a   Cherifi, S ^a   Kiskinova, M ^a  

^a SINCROTRONE TRIESTE   (Italy)

Author keywords

Electronic structure; LEEM; Morphology; Ultrathin Pd films; XPEEM

Indexed keywords

BAND STRUCTURE; ELECTRON EMISSION; ELECTRON MICROSCOPY; ELECTRONIC STRUCTURE; FERMI LEVEL; LOW ENERGY ELECTRON DIFFRACTION; MORPHOLOGY; PALLADIUM; TUNGSTEN; X RAY PHOTOELECTRON SPECTROSCOPY;

LOW-ENERGY ELECTRON DIFFRACTION (LEED); ULTRATHIN PD FILMS; VALENCE BANDS; X-RAY PHOTOELECTRON MICROSCOPY (XPEEM);

ULTRATHIN FILMS;

EID: 4644262178     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.05.198     Document Type: Conference Paper

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