Role of an energy-dependent inner potential in quantitative low-energy electron diffraction

Surface Science

Volumn 458, Issue 1, 2000, Pages 155-161

  Walter, S ^a   Blum, V ^a   Hammer, L ^a   Muller S ^a   Heinz, K ^a   Giesen, M ^b  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EPITAXIAL GROWTH; LATTICE CONSTANTS; LOW ENERGY ELECTRON DIFFRACTION; MORPHOLOGY; SINGLE CRYSTALS; SURFACE ROUGHNESS; SURFACE STRUCTURE; X RAY DIFFRACTION ANALYSIS;

ENERGY DEPENDENT INNER POTENTIAL; LOW INDEX SINGLE CRYSTAL SURFACES;

COPPER;

EID: 0033691534     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)00433-7     Document Type: Article

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