In situ transmission electron microscope study of single asperity sliding contacts

Tribology International

Volumn 43, Issue 5-6, 2010, Pages 1099-1103

  Anantheshwara, K ^a   Bobji, M S ^a  

^a INDIAN INSTITUTE OF SCIENCE   (India)

Author keywords

In situ transmission electron microscopy; Nano tribology

Indexed keywords

CONTACT INTERACTION; CONTACTING SURFACES; DIRECT OBSERVATION; IN-SITU TRANSMISSION; LOCAL GEOMETRY; NANO SCALE; SINGLE ASPERITY; SLIDING CONTACTS; SUBSURFACE DEFORMATION; TEM OBSERVATIONS; TRANSMISSION ELECTRON MICROSCOPE; TRANSPARENT SURFACES; TUNGSTEN PROBES;

DEFORMATION; ELECTRON MICROSCOPES; ELECTRONS; IN SITU PROCESSING; NANOTRIBOLOGY; SEMICONDUCTOR QUANTUM WIRES; SPECIMEN PREPARATION; TUNGSTEN;

TRANSMISSION ELECTRON MICROSCOPY;

EID: 77549085701     PISSN: 0301679X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.triboint.2009.12.066     Document Type: Article

References (21)

1. Bowden F.B., and Tabor D. The friction and lubrication of solids (1950), Oxford University Press, Oxford
2. Singer L., and Pollock H.M. Fundamentals of friction: macroscopic and microscopic processes (1992), Kulwer Academic Publishers, Netherlands
3. Spence J.C.H. A scanning tunneling microscope in a side entry holder for reflection electron microscopy in Phillips EM400. Ultramicroscopy 25 (1988) 165-170
4. Erts D., Lohmus A., Lohmus R., and Olin H. Instrumentation of STM and AFM combined with transmission electron microscope. Appl Phys A 72 71 (2001) S71-S74
5. Fujisawa S., and Kizuka T. Lateral displacement of an AFM tip observed by in-situ TEM/AFM combined microscopy: the effect of the friction in AFM. Tribology Letters 15 2 (2003) 163-168
6. Wall M.A., and Dahmen U. An in situ nanoindentation specimen holder for a high voltage transmission electron microscope. Microscopy Research and Technique 42 (1998) 248-254
7. Minor A.M., Morris Jr. J.W., and Stach E.A. Quantitative in situ nanoindentation in an electron microscope. Appl Phys Lett 79 11 (2001) 1625-1627
8. Bobji M.S., Ramanujan C.S., Pethica J.B., and Inkson B.J. A miniaturized TEM nanoindenter for studying material deformation in situ. Meas Sci and Technol 17 (2006) 1-6
9. Bobji M.S., Pethica J.B., and Inkson B.J. Indentation mechanics of Cu-Be quantified by an in situ transmission electron microscopy mechanical probe. J Mater Res 20 10 (2005) 2726-2732
10. Minor A.M., Syed Asif S.A., Shan Z., Stach E.A., Cyrankowski E., Wyrobek T.J., et al. A new view of the onset of plasticity during the nanoindentation of aluminium. Nature Materials 5 (2006) 697-702
11. Merkle A.P., and Marks L.D. Liquid-like tribology of gold studied by in situ TEM. Wear 265 (2008) 1864-1869
12. Anantheshwara K., Selvan A.K., Mishra R.K., and Bobji M.S. In-situ transmission electron microscope study of deformation of an aluminium alloy tribolayer. Scripta Matrialia 60 (2009) 623-626
13. Rabinowicz E. Friction and wear of materials (1995), John Wiley and Sons, Inc.
14. Ibe J.P., Bey Jr. P.P., Brandow S.L., Brizzolara R.A., Burnham N.A., DiLella D.P., et al. On electrochemical etching of tips for scanning tunneling microscopy. J Vac Sci Technol A 8 4 (1990) 3570-3575
15. Kumao A., Hashimoto H., and Shiraishi K. Studies on specimen contamination by transmission electron microscopy. Journal of Electron Microscopy 30 3 (1981) 161-170
16. Patterson R.L., and Wayman C.M. The Review of Scientific Instruments 34 11 (1963) 1213-1215
17. Wang JJ, Lockwood AJ, Peng YJ, Xu X, Bobji MS, Inkson BJ. The formation of carbon nanostructures by in situ TEM mechanical nanoscale fatigue and fracture of carbon thin films. Nanotechnology 2009;20(30):305706.
18. Meyer E., Hug H.J., and Bennewitz R. Scanning probe microscopy (2004), Springer, Berlin
19. Timoshenko S. Strength of materials (1986), CBS Publishers and Distributors, India
20. Pethica J.B., and Sutton A.P. On the stability of the tip and flat at very small separations. J Vac Sci Technol A 6 4 (1988) 2490-2494
21. Williams J. Engineering tribology (2005), Cambridge University Press, Cambridge